Tandetron Laboratory (NPI)
- Tandetron 4130 MC – a compact, multipurpose electrostatic tandem accelerator system with terminal voltage varying from 200 kV to 3 MV; ion beams with energies ranging from 400 keV to 24 MeV of almost all elements of the periodic system, ion currents from nA to microA.
- Rutherford Back-Scattering spectrometry (RBS), a high sensitivity for heavy elements, low detection limit and about 10 nm depth resolution in elemental depth profiling.
- Elastic Recoil Detection Analysis (ERDA), non-destructive depth profiling of light elements in bulk samples.
- Time of Flight (TOF)-ERDA, distinguishes the outgoing light ions and recoiled atoms according to their mass.
- Particle Induced X-Ray Emission spectroscopy (PIXE), light elements analysis with a high sensitivity detection limit down to 1 ppm.
- Particle Induced Gamma-Ray Emission spectroscopy (PIGE), light elements analysis with a detection limit up to 1000 ppm.
- External beam, investigation of samples unstable under vacuum conditions, biological samples or samples too large to be mounted in a vacuum chamber.
- Ion Micro-beam, focusing on an ion beam to dimensions of about 1µm scanning on a sample, a versatile piece of equipment that allows 3D elemental mapping of microstructures.
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